Shape resonances in the angle-resolved photoelectron spectroscopy of the Si 2p shell of SiCl4

Publisher Website
Google Scholar
Abstract
The partial cross sections and angular distribution parameters, β, have been determined for the 2p subshell in SiCl4. These data were obtained with angle‐resolved photoelectron spectroscopy and the use of synchrotron radiation for a range of photon energies from 114 to 150 eV. The same quantities were calculated by use of a multiple scattering Xα method, and the agreement between experiment and theory is very good. In particular, the behavior of shape resonances was well predicted. The nature of shape resonances as a function of molecular orbitals in SiCl4 is discussed, and the importance of such intercomparison is emphasized.