Determination of thickness and refractive index of SiO2 films on silicon wafers using an Abbe refractometer
- 1 October 1991
- journal article
- Published by Elsevier in Optics Communications
- Vol. 85 (5-6) , 381-384
- https://doi.org/10.1016/0030-4018(91)90567-w
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Interspecimen Comparison of the Refractive Index of Fused Silica*,†Journal of the Optical Society of America, 1965