Structure of glassy fast ion conductors: differential anomalous X-ray scattering study of AgGeSe glass using synchrotron radiation
- 1 December 1988
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 107 (1) , 88-100
- https://doi.org/10.1016/0022-3093(88)90097-x
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Differential anomalous-x-ray-scattering study of icosahedral and amorphousPhysical Review Letters, 1986
- Determination of the anomalous scattering factors for Cu, Ni and Ti using the dispersion relationJournal of Applied Crystallography, 1984
- Anomalous X-ray scattering factors calculated from experimental absorption spectraJournal of Physics C: Solid State Physics, 1984
- Local structure of amorphous MO50Ni50 determined by anomalous x-ray scattering using synchroton radiationSolid State Communications, 1983
- Application of Differential Anomalous X-Ray Scattering to Structural Studies of Amorphous MaterialsPhysical Review Letters, 1981
- Structure de Ag8GeSe6β'Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1980
- Die Kristallstruktur von GermaniumdiselenidActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1976
- Structural studies of glassy CuAs and Cu- alloysPhysical Review B, 1974
- Optical-Absorption Edge and Raman Scattering inGlassesPhysical Review B, 1973
- THE ATOMIC ARRANGEMENT IN GLASSJournal of the American Chemical Society, 1932