A profile-fitting method for the analysis of diffractometer intensity data

• 1 July 1982
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
• Vol. 38  (4) , 537-549
• https://doi.org/10.1107/s0567739482001132

Abstract

Keywords

• DATA REDUCTION
• DIFFRACTOMETER DATA
• VARIOUS PROCEDURES
• ASSUMPTIONS
• BIAS
• INTEGRATED PEAK
• COLLECTED USING
• REFECTIONS
• ESTIMATION