Application of a new method for the study of surface topography in processes of surface etching and corrosion of industrial glasses, electron emission microscopy
- 31 July 1976
- journal article
- Published by Elsevier in Surface Technology
- Vol. 4 (4) , 381-394
- https://doi.org/10.1016/0376-4583(76)90008-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- X-ray measurement of the (111) surface relaxation in goldSurface Science, 1972
- Anwendung der Emissions-Elektronenmikroskopie in der Metallographie / The Use of the Emission Electron Microscope in MetallographyPractical Metallography, 1969
- III Surface Deterioration of Optical GlassesPublished by Elsevier ,1965