Calculating the effective pattern rate for high-speed board test applications

• 1 May 1989
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Industrial Electronics
• Vol. 36  (2) , 164-174
• https://doi.org/10.1109/41.19065

Abstract

Keywords

• BOARD TEST
• EFFECTIVE PATTERN RATE
• RATE BASED
• SPEED BOARD
• VLSI
• TEST APPLICATIONS
• CALCULATING THE EFFECTIVE