Effect of surface traps on characteristics of insulated-gate field-effect transistors
- 1 March 1965
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 8 (3) , 267-274
- https://doi.org/10.1016/0038-1101(65)90142-5
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Theory of the space-charge-limited surface-channel dielectric triodeSolid-State Electronics, 1964