On the measurement of conduction current in AC thin-film electroluminescent display devices
- 1 December 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 11 (12) , 573-575
- https://doi.org/10.1109/55.63043
Abstract
Estimates are obtained for errors associated with the use of a capacitive bridge method for the measurement of the conduction current-time waveform in AC thin-film electroluminescent display devices. The error is a function of the shape and the slew rate of the excitation voltage pulses and can be quite large. In general, the bridge method underestimates the value of conduction current. An improved technique for measuring the current waveform is outlined. The proposed method is more accurate and more generally applicable.<>Keywords
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