Dielectric material measurement of thin samples at millimeter wavelengths

This publication has 7 references indexed in Scilit:

• A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies
  IEEE Transactions on Instrumentation and Measurement, 1989
• Attenuation measurement of very low loss dielectric waveguides by the cavity resonator method applicable in the millimeter/submillimeter wavelength range
  IEEE Transactions on Microwave Theory and Techniques, 1988
• Polyaniline, a novel conducting polymer. Morphology and chemistry of its oxidation and reduction in aqueous electrolytes
  Journal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1986
• Simultaneous Measurement of Complex Permittivity and Permeability in the Millimeter Region by a Frequency-Domain Technique
  IEEE Transactions on Instrumentation and Measurement, 1984
• Automatic measurement of complex dielectric constant and permeability at microwave frequencies
  Proceedings of the IEEE, 1974
• Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques
  IEEE Transactions on Instrumentation and Measurement, 1970
• Measurement of RF properties of materials a survey
  Proceedings of the IEEE, 1967