Magnetic bubble reliability testing — component and system level aspects: J. E. Davies IEEE 18th Annual Proceedings, Reliability Physics 1980, Las Vegas, Nevada, p. 83 (1980)
- 31 August 1982
- journal article
- abstracts
- Published by Elsevier in Microelectronics Journal
- Vol. 13 (4) , 43
- https://doi.org/10.1016/s0026-2692(82)80033-5
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