Computer-Aided Analysis of Integrated Circuit Reliability

Publisher Website

1 January 1990

book chapter
Published by Springer Nature

p. 127-136
https://doi.org/10.1007/978-94-009-2482-6_7

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

The rationale of reliability prediction
Quality and Reliability Engineering International, 1985
The failure rate function estimated from parameter drift measurements
Microelectronics Reliability, 1980