An X-Ray Method for Accurate Determination of Lattice Strains of Crystals
- 1 November 1968
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 39 (11) , 1647-1650
- https://doi.org/10.1063/1.1683194
Abstract
A simple x‐ray strainmeter is described which enables us to determine small lattice strains of crystals with the sensitivity of 2×10−6 even in the region of 45° of Bragg angle. The principal feature of this apparatus lies in the large camera radius of 2630 mm. The strainmeter permits not only determination of the thermal expansion at 1°C but also measurement of piezoelectric constants of minute crystals where conventional resonance‐antiresonance methods cannot be used. The practical application of this apparatus for detection of small spontaneous lattice strain, say 3′40″ of pure shear xy of Fe–I‐boracite, which has recently been found to be ferroelectric in its low temperature form, is demonstrated.Keywords
This publication has 4 references indexed in Scilit:
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- Mössbauer effect and optical evidence for new phase transitions in Fe-Cl-, Fe-Br-, Fe-I-, Co-Cl- and Zn-Cl- boraciteSolid State Communications, 1967
- Origin of the Visibility of the Antiparallel 180° Domains in Barium TitanatePhysical Review Letters, 1963
- The crystal structure of boraciteActa Crystallographica, 1951