Highly Oriented Co Soft Magnetic Films on Si Substrates
- 1 January 1999
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
Thin Co and Co based alloy films with the face centered cubic (FCC) structure have been epitaxially grown on single crystal Si wafers by sputter deposition. Epitaxial orientation relationships have been determined by x-ray diffraction, x-ray pole figure scans and TEM. Magnetic properties have been characterized using vibrating sampling magnetometer (VSM), torque magnetometer and BH loop tracer. Soft magnetic properties have been observed for the pure Co films.Keywords
This publication has 4 references indexed in Scilit:
- Unicrystal Co–alloy media on Si(110)Journal of Applied Physics, 1999
- Highly oriented perpendicular Co-alloy media on Si(111) substratesJournal of Applied Physics, 1999
- Highly oriented NiFe soft magnetic films on Si substratesJournal of Applied Physics, 1999
- Epitaxial Ag templates on Si(001) for bicrystal CoCrTa mediaJournal of Applied Physics, 1997