Wavelength Identification of Ultrasoft X Rays by the Critical Angle of Total Reflection
- 1 November 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (12) , 4565-4568
- https://doi.org/10.1063/1.1709185
Abstract
If absorption in the reflector is low, ultrasoft x rays exhibit a well‐defined critical angle of total reflection. Experiments with simple apparatus verify critical angles calculated for paraffin of θc≈4° for carbon radiation (λ=44.7 Å) and θc≈6° for boron radiation (λ=67.7 Å). Utilization of this concept in a low‐resolution (10<λ/Δλ<20) instrument for the chemical analysis of carbon and boron by a paraffin reflector and of nitrogen, oxygen, and fluorine by a lithium fluoride mirror is suggested.This publication has 2 references indexed in Scilit:
- Application of Multilayer Analyzers to 15-150 Å Fluorescence Spectroscopy for Chemical and Valence Band AnalysisAdvances in X-ray Analysis, 1965
- Resistance Strip Magnetic Electron MultiplierReview of Scientific Instruments, 1961