Low noise, high voltage secondary emission ion detector for polyatomic ions

This publication has 12 references indexed in Scilit:

• Secondary electron emission induced by 5–30-keV monatomic ions striking thin oxide films
  Journal of Applied Physics, 1975
• Spectrometer for Measuring Secondary Electron Yields Induced by Ion Impacts on Thin Film Oxide Surfaces
  Review of Scientific Instruments, 1973
• The measurement of small ion currents with the aid of photomultipliers
  International Journal of Mass Spectrometry and Ion Physics, 1972
• Molecular Beams of Macroions. II
  The Journal of Chemical Physics, 1970
• Molecular Beams of Macroions
  The Journal of Chemical Physics, 1968
• The Mass Spectrum of a Compound of Formula C₇₂H₂₄O₈F₁₂₈N₄P₄ and Molecular Weight 3628.
  Analytical Chemistry, 1966
• Amplification factors of a particle multiplier for multiply charged noble gas ions
  Physica, 1966
• Measurement of the Statistics of Secondary Electron Emission
  IEEE Transactions on Nuclear Science, 1966
• Use of the D-D reaction to investigate penetration of 20 keV deuterons in gold and aluminum
  Nuclear Instruments and Methods, 1965
• Scintillation Type Mass Spectrometer Ion Detector
  Review of Scientific Instruments, 1960