Electrical resistivity measurements of conductors in the diamond-window, high-pressure cell

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Abstract
The electrical resistance measurement of metallic conducting materials can be done in situ in a diamond‐window, high‐pressure cell with a four‐lead arrangement designed to avoid contact and lead‐wire resistances. Variants of the general method include designs for long (several cm) and short (less than 1 mm) length of samples material, and for the use of solid and fluid pressure‐transmitting media.

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