Evidence for oxygen underlayer formation at near-liquid-nitrogen temperatures on Zr(0001)

1 March 1988

journal article
Published by American Vacuum Society in Journal of Vacuum Science & Technology A

Vol. 6 (2) , 210-212
https://doi.org/10.1116/1.574982

Abstract

When a clean Zr(0001) crystal is exposed to oxygen at 82 K, the work function initially decreases by ∼250 mV for an exposure of 0.7 to 0.8 L. Annealing this surface to ∼550 K produces a further decrease in work function of ∼300 mV, and a ‘‘(2×2)‐like’’ low‐energy electron diffractionpattern is observed. The initial decrease in work function upon oxygen adsorption at 82 K is believed to be due to oxygen incorporation into the Zr lattice.

Keywords

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