SEETEST: a system dedicated to the characterisation of memory sensitivity to SEE
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- On the suitability of non-hardened high density SRAMs for space applicationsIEEE Transactions on Nuclear Science, 1991
- SEU test techniques for 256 K static RAMs and comparisons of upsets by heavy ions and protonsIEEE Transactions on Nuclear Science, 1988
- Radiation testing of semiconductor devices for space electronicsProceedings of the IEEE, 1988