Studies on the Boundary between Etched and Ground Regions of Ge and Si Single Crystal Surfaces by X-Ray Diffraction Topography
- 1 April 1961
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 16 (4) , 733-736
- https://doi.org/10.1143/jpsj.16.733
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Schatten von Versetzungslinien im Röntgen-DiagrammZeitschrift für Naturforschung A, 1958