Properties of Thin Optical Ge Films Related to their Technology Dependent Structure
- 16 March 1991
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 124 (1) , 199-210
- https://doi.org/10.1002/pssa.2211240119
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The interaction of water with solid surfaces: Fundamental aspectsSurface Science Reports, 1987
- Grain growth observation of 〈100〉 textured germanium film by transmission electron microscopyApplied Physics Letters, 1987
- Thickness-dependent void fraction of rf-sputtered amorphous Ge films by spectroscopic ellipsometryApplied Physics Letters, 1986
- Geometry of thin-film morphologyJournal of Applied Physics, 1985
- Determination of the absorption edge of a thin film from transmission measurementsJournal of the Optical Society of America A, 1984
- Infrared reflection-absorption spectroscopy of adsorbed moleculesSurface Science Reports, 1983
- The optical properties of amorphous and crystalline germaniumJournal of Physics C: Solid State Physics, 1976
- Effect of Deposition Parameters on the Crystallinity of Evaporated Germanium FilmsJournal of Applied Physics, 1969