Time-resolved frequency chirp measurement using a silicon-wafer etalon
- 1 April 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 9 (4) , 475-477
- https://doi.org/10.1109/68.559393
Abstract
A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.Keywords
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