New procedure for the extraction of basic a-Si:H TFT model parameters in the linear and saturation regions
- 1 July 2001
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 45 (7) , 1077-1080
- https://doi.org/10.1016/s0038-1101(01)00143-5
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- SPICE Models for Amorphous Silicon and Polysilicon Thin Film TransistorsJournal of the Electrochemical Society, 1997
- Characterization and Modeling of Frequency Dispersion in Amorphous Silicon Thin Film TransistorsMRS Proceedings, 1997