Free Carrier Reduction in Vacuum‐Annealed S‐, Sn‐, and Ge‐Doped (100) InP

• 1 July 1984
• journal article
• Published by The Electrochemical Society in Journal of the Electrochemical Society
• Vol. 131  (7) , 1716-1720
• https://doi.org/10.1149/1.2115945

Abstract