Characterization of a flat-field grazing-incidence XUV spectrometer

• 31 December 1993
• journal article
• Published by Elsevier in Journal of X-Ray Science and Technology
• Vol. 4  (1) , 8-17
• https://doi.org/10.1016/s0895-3996(05)80029-1

Abstract

Keywords

• FLAT FIELD
• GRAZING INCIDENCE
• XUV SPECTROMETER
• MICROPLASMAS
• PLASMA AS A SOURCE
• MIRROR
• LASER