DETERMINATION OF DIPS AND DEPTHS OF GEOLOGICAL LAYERS BY THE SEISMIC REFRACTION METHOD

1 April 1954

journal article
Published by Society of Exploration Geophysicists in Geophysics

Vol. 19 (2) , 242-254
https://doi.org/10.1190/1.1437988

Abstract

Equations are developed for computing depths and dips of 1, 2, 3, ⋯, n inclined interfaces from seismic refraction data without the aid of graphical techniques.

Keywords

SEISMIC REFRACTION