Selftesting CMOS operational amplifier
- 16 July 1992
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 28 (15) , 1452-1454
- https://doi.org/10.1049/el:19920924
Abstract
The testability of failures modelled by bridges and stuck-open faults in CMOS current mode based operational amplifiers is investigated. The functional and IDD current effects caused by these types of failure in the circuits are presented. A current sensing circuit oriented to BIST, based on current mirrors is also developed. From these results, a selftesting operational amplifier circuit is proposed.Keywords
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