Abstract
Transport properties of electrons in a novel in‐plane superlattice structure are studied and the field‐effect transistor action has been demonstrated. The structure consists of an n‐AlGaAs/GaAs modulation‐doped heterojunction in which an array of monolayer‐thick AlAs grid is embedded with an average period of 162 Å in the channel region of the heterojunction. This grid has been prepared with molecular beam epitaxy by depositing a half monolayer of AlAs on a GaAs (001) vicinal plane, where periodically spaced atomic terraces are formed. The electron mobilities μ parallel and normal to the grid are measured as functions of electron concentration NS. While the mobility ratio (μ) is nearly unity at low NS, the ratio is found to get as large as 2.2 as NS increases. This anisotropic behavior of μ is well accounted for by the calculated nonparabolicity in the miniband structure of in‐plane superlattices.