The Intensity Measurement of Small X-Ray Diffraction Spots by Projection of a Positive Print
- 1 December 1953
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 43 (12) , 1183-1185
- https://doi.org/10.1364/josa.43.001183
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 5 references indexed in Scilit:
- Study of Imperfections of Crystal Structure in Polycrystalline Materials: Low Carbon Alloy and Silicon FerriteJournal of Applied Physics, 1952
- An Improved Positive Print Method for Measuring Integrated Intensities of X-Ray Diffraction Patterns*Journal of the Optical Society of America, 1952
- A New X-Ray Diffraction Method for Studying Imperfections of Crystal Structure in Polycrystalline SpecimensJournal of Applied Physics, 1951
- The Positive Print Method of Measuring X-ray Reflexions from a Single CrystalJournal of Scientific Instruments, 1948
- The integration of large numbers of X-ray crystal reflectionsProceedings of the Physical Society, 1938