Double patterns in reflection high energy electron diffraction for thin film structure observations
- 1 May 1976
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 47 (5) , 542-544
- https://doi.org/10.1063/1.1134686
Abstract
A new technique to obtain reflection high energy electron diffraction (RHEED) double patterns has been developed. This technique has allowed us to obtain simultaneously the RHEED patterns of a thin film and of the single crystal substrate on which the same thin film has been grown. It is possible to have an identification and a relative calibration, on the same exposure, of the crystalline parameters of the film under observation utilizing the simultaneous diffraction pattern of the substrate.Keywords
This publication has 7 references indexed in Scilit:
- Structure of PbxSn1−xTe films r.f. sputtered onto thin metallic structuresThin Solid Films, 1975
- Infrared detector arrays by new technologiesProceedings of the IEEE, 1975
- PbxSn1−xTe layers by rf multicathode sputteringJournal of Applied Physics, 1974
- The Growth of Au on PbS, PbSe, PbTe, and SnTe Thin Film SubstratesJournal of Vacuum Science and Technology, 1973
- LEED STUDY OF THE EPITAXIAL GROWTH OF Au ON PbS (100) SURFACEApplied Physics Letters, 1969
- Role of Surface Defects in the Epitaxial Growth of Some fcc Metals on Potassium Chloride Cleaved in Ultrahigh VacuumJournal of Applied Physics, 1968
- EPITAXIAL GROWTH OF SPUTTERED SILVER FILMS AT LOW TEMPERATURESApplied Physics Letters, 1966