Measurement of Urbach edge and midgap states in amorphous silicon p-i-n devices
- 31 December 1993
- journal article
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 31 (3) , 349-356
- https://doi.org/10.1016/0927-0248(93)90129-q
Abstract
No abstract availableKeywords
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