Comparison between the constant-potential steps of two point-contact Josephson junctions
- 15 May 1973
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 22 (10) , 549-550
- https://doi.org/10.1063/1.1654503
Abstract
Microwave‐induced steps in the current‐potential characteristics of two niobium point‐contact junctions have been compared using a SQUID voltmeter with a resolution of less than 10−12 V. It has been established that the uncertainty in step potential at the 1‐mV level is less than 2 in 109.Keywords
This publication has 12 references indexed in Scilit:
- Comparison of Microwave-Induced Constant-Voltage Steps in Pb and Sn Josephson JunctionsPhysical Review B, 1972
- Monitoring the NSL Standard of EMF Using the AC Josephson EffectMetrologia, 1972
- Low Temperature Voltage Divider and Null DetectorReview of Scientific Instruments, 1972
- Intrinsic Fluctuations in the Driven Josephson OscillatorPhysical Review Letters, 1971
- Determination ofBased on the ac Josephson EffectPhysical Review Letters, 1970
- The Josephson Effect and e/hAmerican Journal of Physics, 1970
- ac-Josephson-Effect Determination ofwith Sub—Part-Per-Million AccuracyPhysical Review Letters, 1970
- Influence of External Noise on Microwave-Induced Josephson StepsJournal of Applied Physics, 1970
- Determination of, Using Macroscopic Quantum Phase Coherence in Superconductors. I. ExperimentPhysical Review B, 1969
- Experimental Comparison of the Josephson Voltage-Frequency Relation in Different SuperconductorsPhysical Review Letters, 1968