Extended spectroscopy with high-resolution scanning ellipsometry
- 15 November 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 12 (10) , 4008-4011
- https://doi.org/10.1103/physrevb.12.4008
Abstract
The extrapolation of dielectric-function data taken over the near ir-uv spectral region by high-resolution wavelength-scanning ellipsometry is investigated. The possibility of determining the amplitudes of a number of oscillators outside the measurement interval by application of the Kramers-Kronig integral allows spectroscopic information to be determined in experimentally inaccessable spectral regions. Several examples are given.Keywords
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