Non-local impact ionization in silicon devices

Publisher Website

9 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iedm.1991.235484

Abstract

No abstract available

This publication has 3 references indexed in Scilit:

Impact ionization in silicon: A review and update
Solid-State Electronics, 1990
Monte carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects
Physical Review B, 1988
Measurement of the ionization rates in diffused silicon p-n junctions
Solid-State Electronics, 1970