Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip
- 1 June 2000
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 39 (6S)
- https://doi.org/10.1143/jjap.39.3707
Abstract
We succeeded in observing individual single-walled carbon nanotubes (SWNTs) using an atomic force microscope (AFM) in the tapping mode by paying attention to the preparation of both samples and AFM tips. To disentangle the bundles of SWNTs, we added a small amount of amine into N,N-dimethylformamide. To achieve a high resolution in tapping-mode AFM imaging, we used carbon nanotube (CNT) tips whose radii could be reduced. We were able to image individual SWNTs using CNT tips with widths that were half of those imaged using conventional silicon tips. With this improved resolution, we could clearly resolve the two SWNTs lying parallel on a mica substrate.Keywords
This publication has 19 references indexed in Scilit:
- Direct Growth of Single-Walled Carbon Nanotube Scanning Probe Microscopy TipsJournal of the American Chemical Society, 1999
- Conductivity and atomic structure of isolated multiwalled carbon nanotubesEurophysics Letters, 1998
- Fullerene PipesScience, 1998
- Multiprobe Transport Experiments on Individual Single-Wall Carbon NanotubesPhysical Review Letters, 1998
- Carbon Nanotube Tips: High-Resolution Probes for Imaging Biological SystemsJournal of the American Chemical Society, 1998
- Individual single-wall carbon nanotubes as quantum wiresNature, 1997
- Nanotubes as nanoprobes in scanning probe microscopyNature, 1996
- Crystalline Ropes of Metallic Carbon NanotubesScience, 1996
- Electrical conductivity of individual carbon nanotubesNature, 1996
- Probing Electrical Transport in Nanomaterials: Conductivity of Individual Carbon NanotubesScience, 1996