The reliability of two-terminal parallel-series networks subject to two kinds of failure
- 1 January 1976
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 15 (6) , 535-549
- https://doi.org/10.1016/0026-2714(76)90269-9
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Some Aspects of the Statistical Approach to ReliabilityJournal of the Royal Statistical Society. Series A (General), 1973
- Two-terminal series-parallel networksAdvances in Applied Probability, 1972
- Optimum Redundancy w hen Components are Subject to Two Kinds of FailureJournal of the Society for Industrial and Applied Mathematics, 1963
- Multi-Component Systems and Structures and Their ReliabilityTechnometrics, 1961
- Criteria for Determining Optimum RedundancyIRE Transactions on Reliability and Quality Control, 1960
- Optimum Component Redundancy for Maximum System ReliabilityOperations Research, 1957
- Reliable circuits using less reliable relaysJournal of the Franklin Institute, 1956
- The Number of Two‐Terminal Series‐Parallel NetworksJournal of Mathematics and Physics, 1942