Hologram Interferometry Using Two Reference Beams

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Abstract
A double-exposure hologram interferometer using two reference beams is described which restores fringe visibility after processing and permits to obtain various fringe patterns from a single hologram. It has been successfully applied to the deformation measurements on an object of local variations in lateral translations. Experiments are also presented on changing fringe patterns suitable to interpretations. Expressions were derived for the localization of fringes of diffusely reflecting objects and compared with the experimental results. A good agreement was obtained between them.

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