Calibration and Use of an Electron Microscope for Precision Micromeasurements in Thin Film Materials
- 1 January 1967
- journal article
- review article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 19 (1) , 7-34
- https://doi.org/10.1002/pssb.19670190102
Abstract
No abstract availableKeywords
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