Minimization of Non-Uniform Ion-Thinning Effects in Thin Film Transverse Specimens for Transmission Electron Microscopy
- 1 January 1991
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
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This publication has 1 reference indexed in Scilit:
- Cross‐Section preparation for tem of film‐substrate combinations with a large difference in sputtering yieldsJournal of Electron Microscopy Technique, 1986