Abstract
The 1.03‐V solar photoemf generated by this CdSe/p+n Si photoanode lends itself to solar storage applications. We present evidence that the 21‐mA/cm2 short circuit solar photocurrent results from a low resistance tunnel path between the CdSe conduction band and the p+ Si valence band. We use the dark electron current to calculate that the hole quasi‐Fermi level at the CdSe surface of the solar illuminated open circuited photoanode lies 0.16 V below the CdSe corrosion potential. Hence even on open circuit the CdSe surface of the illuminated photoanode will corrode.

This publication has 7 references indexed in Scilit: