Thickness Fringes of Complicated Profiles in Electron Micrographs of Magnesium Oxide Wedge Crystals
- 1 March 1969
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 8 (3) , 296-304
- https://doi.org/10.1143/jjap.8.296
Abstract
Thickness fringes from single crystals of magnesium oxide were taken at 100 kV, 350 kV and 500 kV. By the use of a tilting stage, the direction of the incident beam was adjusted nearly parallel to the [01̄1] direction where many diffracted beams were excited and the complicated thickness fringes were produced. Their profiles and spacings were studied systematically. It was proved that the profiles become more complicated at higher voltages and that spacings are roughly in agreement with those calculated by using Bethe's second approximation.Keywords
This publication has 3 references indexed in Scilit:
- Dynamical effects in high-voltage electron diffractionActa Crystallographica Section A, 1968
- Many-Ray Approximation in the Dynamical Theory of Electron DiffractionJournal of the Physics Society Japan, 1966
- Electron Microscope Study on the Extinction and Absorption of 100 kV Electrons in Magnesium Oxide Single CrystalsJapanese Journal of Applied Physics, 1965