Orientation-dependent critical currents in Y1Ba2Cu3O7−x epitaxial thin films: Evidence for intrinsic flux pinning?

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Abstract
For YBCO epitaxial thin films the basal plane transport critical current density Jc, flowing perpendicular to an applied magnetic field H, depends sensitively on the orientation of the crystal with respect to H. In particular, Jc is sharply peaked and greatly enhanced when H is precisely parallel to the copper‐oxygen planes. Experiments on a series of epitaxial monolithic and superconductor‐insulator multilayer thin films provide clear evidence that the enhancement is a bulk, rather than surface or thin sample, phenomenon. Measurements of the orientation dependence are presented and compared with a model of ‘‘intrinsic flux pinning’’ by the layered crystal structure.

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