UHV-TEM-REM Studies of Si(111) Surfaces

• 1 January 1991
• journal article
• Published by Oxford University Press (OUP) in Progress of Theoretical Physics Supplement
• Vol. 106, 303-314
• https://doi.org/10.1143/ptps.106.303

Abstract

Keywords

• PHASE TRANSITION
• ELECTRON MICROSCOPE
• THIN FILM
• ULTRA HIGH VACUUM