Determination Of Process-dependent Critical SPICE Parameters For Application-specific ICs

Publisher Website

24 August 2005

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 73-78
https://doi.org/10.1109/icmts.1988.672932

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

BSIM: Berkeley short-channel IGFET model for MOS transistors
IEEE Journal of Solid-State Circuits, 1987
Small-signal MOSFET models for analog circuit design
IEEE Journal of Solid-State Circuits, 1982
Modeling and simulation of insulated-gate field-effect transistor switching circuits
IEEE Journal of Solid-State Circuits, 1968