Unified approach to photographic methods for obtaining the angles of incidence in low-energy electron diffraction
- 1 October 1982
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 53 (10) , 1566-1572
- https://doi.org/10.1063/1.1136837
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Fast computer-controlled mirror system for intensity measurements in low-energy electron diffractionReview of Scientific Instruments, 1982
- Energy shift procedure for the inner potential in LEED crystallographySurface Science, 1981
- Saturation of the Image Potential Observed in Low-Energy Electron Reflection at Cu(001) SurfacePhysical Review Letters, 1980
- LEED averaging study of adsorption structures involving substrate reconstructionSurface Science, 1980
- Electronic surface resonances of Cu(001)Surface Science, 1979
- Coherence length and/or transfer width?Surface Science, 1979
- Surface-Resonance Fine Structure in Low-Energy Electron DiffractionPhysical Review Letters, 1977
- A Rotatable Target Holder for a LEED DiffractometerReview of Scientific Instruments, 1973
- Low-Energy-Electron-Diffraction Rotation Diagrams for the (100) Face of AluminumPhysical Review B, 1972
- Kinematic Low-Energy Electron-Diffraction Intensities from Averaged Data: A Method for Surface CrystallographyPhysical Review Letters, 1971