Beam-leaded and intraconnected integrated circuits

• 1 January 1964
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• https://doi.org/10.1109/iedm.1964.187450

Abstract

Keywords

• THIN FILM TRANSISTORS
• PARASITIC CAPACITANCE
• DIGITAL CIRCUITS
• INTEGRATED CIRCUIT
• THIN FILM
• LEAD
• CERAMICS
• RESISTORS
• SILICON