Atomic force microscopy: General aspects and application to insulators

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Abstract
Atomic force microscopy (AFM) has been proposed to map the force of interaction between the sample and a sharp tip. For the first time atomic resolution imaging of nonconducting surfaces is possible. Our aim is to apply the atomic force microscope to a variety of materials. We have realized two designs with different approach mechanisms. The force sensing lever is prepared from a piece of metal foil which is electrochemically etched at one end to form a sharp tip. Two different modes of measurement are discussed. Lateral resolution of 2.5 Å has been obtained on noncrystalline quartz. Images of LiF and of optical lenses are presented.

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