SIZE-SELECTIVE MEASUREMENTS OF SILICON-CLUSTER POLARIZABILITIES BY A CLUSTER-BEAM DEFLECTION TECHNIQUE
- 1 February 1996
- journal article
- conference paper
- Published by World Scientific Pub Co Pte Ltd in Surface Review and Letters
- Vol. 03 (01) , 371-375
- https://doi.org/10.1142/s0218625x9600067x
Abstract
Average static electric polarizabilities of small and middle silicon-cluster size ranges have been measured employing a mass-selective molecular beam deflection method. The largest studied clusters contained N=60 atoms of silicon. The polarizabilities of the semiconductor clusters are compared to the results obtained for metal clusters. Especially, the measurements of the midsized semiconductor clusters Si30–Si45 are discussed with regard to the predicted spherical cage-like structures which have been recently by Röthlisberger et al.1 The results for the larger clusters are analyzed in terms of recent experiments of photoluminescence of small silicon nanocrystallites.2This publication has 0 references indexed in Scilit: