Resolution degradation of semiconductor detectors due to carrier trapping
- 1 July 2005
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 546 (1-2) , 209-212
- https://doi.org/10.1016/j.nima.2005.03.026
Abstract
No abstract availableKeywords
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