Description and peak-position determination of a single X-ray diffraction profile for high-accuracy lattice-parameter measurements by the Bond method. I. An analysis of descriptions available
- 1 January 1993
- journal article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
- Vol. 49 (1) , 106-115
- https://doi.org/10.1107/s0108767392006937
Abstract
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