Determination of charge centroids in two-side metallized electrets

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Abstract
A method of determining the centroid of space in two‐side metallized, thin polymer films is discussed. The method is a generalization of the well‐known thermal pulse method and allows the determination of the mean depth without knowledge of the sample history. Results for electron‐beam charged Teflon FEP films (25 μm thick) are shown and are in good agreement with results obtained for one‐side metallized samples by the conventional thermal pulse method. Further agreement is obtained with results, published by Gross et al. [J. Appl. Phys. 4 8, 563 (1982)], obtained by a different measuring technique. Application of the method is shown by monitoring the charge centroid during a short circuit thermally stimulated discharge experiment.